About RC Oswal Himalayan Institute of Nanotechnology

The RC Oswal Himalayan Institute of Nanotechnology is a Centre of Excellence set up in collaboration with Vardhman Textiles Ltd., Ludhiana, and the Foundation for Life Sciences and Business Management at the Shoolini University campus. It is the first Research & Development facility in Himachal Pradesh funded by Vardhman Textiles Ltd.


To provide advanced facilities for Research & Development in the Himalayan region & testing of nanomaterials and nanoproducts to meet global research standards.

Facilities Available

Following facilities are available at the RC Oswal Himalayan Institute of Nanotechnology:

  • Field Emission Scanning Electron Microscopy (FESEM JSM IT 800- Jeol)
  • Atomic Force Microscopy (Core AFM- Nanosurf)
  • Dynamic Light Spectroscopy (DLS Litesizer 500-Anton Paar) 


Field Emission Scanning Electron Microscope (FESEM)

The FESEM JSM-IT800 has ‘In-lens Schottky Plus Field Emission Electron Gun’ for high-resolution imaging with fast elemental mapping and an innovative electron optical control system ‘Neo Engine’. As a common platform, it has a seamless GUI " SEM Center’ for fast elemental mapping with fully embedded JEOL energy dispersive X-ray spectrometer (EDS).


The FESEM JSM-IT800 is equipped with Scintillator Backscattered Electron Detector (SBED) and a Versatile Backscattered Electron Detector (VBED)  to respectively acquire images with high response and sharp material contrast at a low accelerating voltage and to obtain images of 3D, topography, and material contrasts.


  •  Hybrid Lens Version (HL)/ Super Hybrid Lens Version (SHL)
  •  Detection System in JSM- IT 800 (SHL)
  • EDS Mapping with JSM IT-800
  • SBED (Scintillator BSE Detector)
  • VBED (Versatile BSE Detector)
  • High Spatial resolution EDS map



  • Morphological characterisations
  •  Elemental detection and mapping


Atomic Force Microscope (AFM)

The Atomic Force Microscope CoreAFM is an intelligent combination of core components of AFM to achieve maximum versatility and user-friendly applications. The fundamental design of the CoreAFM is equipped to perform Atomic Force Microscopy at its best.


  • Maximum scan range: 100 µm < 5 nm flatness
  •  Maximum Z-range: 12 µm closed loop
  • Detector noise (RMS): typ. 60 pm max. 100 pm
  • Standard Imaging modes
  • Static Force Mode
  • Lateral Force Mode
  • Dynamic Force Mode (Tapping Mode)
  • Phase Imaging Mode



  • Morphological characterisations
  • Electrical properties studies


Dynamic Light Scattering (DLS) system

The Dynamic Light Scattering (DLS) system Litesizer 500 chooses the ideal measurement angle for your sample to ensure the highest data quality.

The three detection angles for DLS measurements in Litesizer 500 (side-, back-, or forward scattering) allow for optimal parameter settings


  •  Light Source: 40 mW 658 nm Laser
  • Measurement Mode (s)
  • Particle size, Zeta potential, Molecular mass, Transmittance
  • Sample Volume: Minimum 20 µL



  • Particle Size analysis
  •  Zeta Potential analysis
  • Molecular Mass study


Scope and Applications of the Facilities Available

The high-end Instrument facility available at the RC Oswal Himalayan Institute of Nanotechnology can be used for broad applications in nanoscience to meet the global standards of research excellence.


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